Field mounting-type test apparatus and method for testing memory component or module in actual PC environment

A field mounting-type test apparatus and method for enhancing competitiveness of a product by simulating various test conditions including a mounting environment for improving quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment thus reducing...

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Bibliographische Detailangaben
Hauptverfasser:	KIM SUNG-YEOL, JANG SEUNG-HO, KWAK YOUNG-KI, CHOI IN-HO, YOO HO-SUN, CHOI WOON-SUP, JANG CHUL-WOONG, YANG IN-SU, LEE JAE-IL
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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Beschreibung
Zusammenfassung:	A field mounting-type test apparatus and method for enhancing competitiveness of a product by simulating various test conditions including a mounting environment for improving quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment thus reducing testing time and cost. The field mounting-type test apparatus includes a mass storage device configured to store logic data simulating a mounting environment of a device under test (DUT) and a tester main frame configured to test the DUT using the logic data.