Localized calibration of programmable digital logic cells

An integrated circuit (IC) includes self-calibrating programmable digital logic circuitry. The IC includes at least one programmable digital logic cell, wherein the first programmable digital logic cell provides (i) a plurality of different accessible circuit configurations or (ii) a voltage level controller. A self-calibration system is provided that includes at least one reference device, a measurement device for measuring at least one electrical performance parameter that can affect a processing speed of the first programmable digital logic cell or at least one parameter that can affect the electrical performance parameter using the reference device to obtain calibration data. A processing device maps the calibration data or a parameter derived therefrom to generate a control signal that is operable to select from the plurality of different accessible circuit configurations or a voltage level output to change the processing speed of the programmable digital logic cell.