Testing an integrated circuit having configurable input/output terminals

Testing an integrated circuit having configurable input/output terminals

Testing an integrated circuit (IC) having numerous terminals coupled to numerous digitally controlled impedance (DCI) modules, where the numerous DCI modules control configurable impedances of the numerous terminals. The IC further includes a control circuit having outputs coupled to enable inputs o...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PATRA MADAN MOHAN, SIMMONS TUYET NGOC
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
TESTING
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Beschreibung
Zusammenfassung:Testing an integrated circuit (IC) having numerous terminals coupled to numerous digitally controlled impedance (DCI) modules, where the numerous DCI modules control configurable impedances of the numerous terminals. The IC further includes a control circuit having outputs coupled to enable inputs of the numerous DCI modules, where operating the IC in a test mode configures the control circuit to selectively couple a control signal to the enable terminals of the numerous DCI modules. One DCI module of the numerous DCI modules can be enabled at a time facilitating testing of the configurable impedances of the I/O terminals.