Devices and methods for assessing a sample's temperature exposure history
Device and methods are provided for assessing a temperature exposure history of a sample that is comprised of a nonmetallic material. To assess the temperature exposure history, the pre-exposure and post-exposure electronic states of the sample are compared. Changes in the electronic state of the sa...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | Device and methods are provided for assessing a temperature exposure history of a sample that is comprised of a nonmetallic material. To assess the temperature exposure history, the pre-exposure and post-exposure electronic states of the sample are compared. Changes in the electronic state of the sample are indicative of the temperature exposure history. |
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