Semiconductor chip with a plurality of scannable storage elements and a method for scanning storage elements on a semiconductor chip

A semiconductor chip subdivided into power domains, at least one of the power domains is separately activated or deactivated and at least a part of the scannable storage elements are interconnected to one or more scan chains. At least one scan chain is serially subdivided into scan chain portions an...

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Bibliographische Detailangaben

Hauptverfasser:	LICHTENAU CEDRIC, JAESCHKE CHRISTOPH, PFLUEGER THOMAS, GEMMEKE TOBIAS, KUENZER JENS, PREISS JOCHEN
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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