Semiconductor chip with a plurality of scannable storage elements and a method for scanning storage elements on a semiconductor chip

Semiconductor chip with a plurality of scannable storage elements and a method for scanning storage elements on a semiconductor chip

A semiconductor chip subdivided into power domains, at least one of the power domains is separately activated or deactivated and at least a part of the scannable storage elements are interconnected to one or more scan chains. At least one scan chain is serially subdivided into scan chain portions an...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LICHTENAU CEDRIC, JAESCHKE CHRISTOPH, PFLUEGER THOMAS, GEMMEKE TOBIAS, KUENZER JENS, PREISS JOCHEN
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A semiconductor chip subdivided into power domains, at least one of the power domains is separately activated or deactivated and at least a part of the scannable storage elements are interconnected to one or more scan chains. At least one scan chain is serially subdivided into scan chain portions and the scan chain portion is arranged within one of the power domains. For at least one scan chain portion a bypass line is provided for passing by scan data and at least one select unit is provided for selecting between the bypass line and the corresponding scan chain portion in dependence of the activated or deactivated state of the corresponding power domains.