Testing an inductive load of a device using a modulated signal

A device has built-in inductive load testing capabilities. The device includes a device housing, an inductive load disposed within the device housing; and test circuitry disposed within the device housing. The test circuitry is constructed and arranged to effectuate application of a modulated test signal to the inductive load, and obtain a result signal in response to the application of the modulated test signal to the inductive load. The test circuitry is further constructed and arranged to generate an output signal indicating that the inductive load is in one of (i) a shorted inductive load state, (ii) a normal inductive load state, and (iii) an abnormally high inductive load state, based on the result signal. Such test circuitry is well-suited for testing a variety of devices having inductors/coils which are susceptible to defects (e.g., a solenoid, a motor winding, various actuator components, etc.).