E-fuse read circuit with dual comparators

An integrated circuit has an E-fuse sense circuit configured to produce a READ voltage according to a fuse resistance of an E-fuse during a READ operation. The integrated circuit also has a reference sense circuit configured to produce a reference voltage according to a reference resistance of an on-chip reference resistor during the READ operation. The reference sense circuit replicates the E-fuse sense circuit. The E-fuse sense circuit and the reference sense circuit are coupled to a comparator that produces a bit value according to a difference between the READ voltage and the reference voltage.