Local skew detecting circuit for semiconductor memory apparatus

A local skew detecting circuit for a semiconductor integrated circuit includes a reference delay block that receives a test signal and generates a reference delay signal by delaying the test signal by a predetermined delay time, and a first timing detecting block coupled with the reference delay blo...

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Bibliographische Detailangaben
1. Verfasser:	CHOI HONG-SOK
Format:	Patent
Sprache:	eng
Schlagworte:	AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATIONOF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE PHYSICS PULSE TECHNIQUE STATIC STORES
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Beschreibung
Zusammenfassung:	A local skew detecting circuit for a semiconductor integrated circuit includes a reference delay block that receives a test signal and generates a reference delay signal by delaying the test signal by a predetermined delay time, and a first timing detecting block coupled with the reference delay block, the first timing detecting block configured to receive the test signal, generate a first delay signal by delaying the test signal by the same predetermined delay time, and detect an enable timing order of the reference delay signal and the first delay signal to generate a first detection signal.