Selective deposition of germanium spacers on nitride

A method of selectively forming a germanium structure within semiconductor manufacturing processes removes the native oxide from a nitride surface in a chemical oxide removal (COR) process and then exposes the heated nitride and oxide surface to a heated germanium containing gas to selectively form...

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Bibliographische Detailangaben
Hauptverfasser: HOLMES STEVEN J, FURUKAWA TOSHIHARU, NAZLE WESLEY C, CHOU ANTHONY I, CHAKRAVARTI ASHIMA B
Format: Patent
Sprache:eng
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Zusammenfassung:A method of selectively forming a germanium structure within semiconductor manufacturing processes removes the native oxide from a nitride surface in a chemical oxide removal (COR) process and then exposes the heated nitride and oxide surface to a heated germanium containing gas to selectively form germanium only on the nitride surface but not the oxide surface.