Quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing

Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for storing, during a process, data associated with a material. Also disclosed are a met...

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Hauptverfasser: BARBER DOUGLAS GORDON BARRON, IHDE SHERYL ANNETTE, LINDSAY JEFFREY DEAN, YOSTEN ROGER DALE, NYGAARD KURT SIGURD, SHAFFER GREGORY DUNCAN, READE WALTER CASWELL, PRICE MICHAEL T, HISE JOHN HARLAND, MARKHAM CHARLES EARL, POKORNY MICHAEL ROY
Format: Patent
Sprache:eng
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Zusammenfassung:Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for storing, during a process, data associated with a material. Also disclosed are a method of collecting, storing, and reporting machine productivity, waste, and delay information on an event basis in a manufacturing system, a method of capturing and storing material history, a method of automating tracking of positions of components used in a process and correlating portions of a component with production problems, an improved inventory management system, and a method of tracking and recording actions of specific operators of a process performed by a machine. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.