Computed tomography systems and related methods involving multi-target inspection

Computed tomography (CT) systems and related methods involving multi-target inspection are provided are provided. In this regard, a representative method includes: simultaneously directing X-rays toward multiple targets from an X-ray source; during the directing of the X-rays, independently reorient...

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Bibliographische Detailangaben
Hauptverfasser:	MCKIM ROYCE, WARNER RODNEY H
Format:	Patent
Sprache:	eng
Schlagworte:	DIAGNOSIS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY HUMAN NECESSITIES HYGIENE IDENTIFICATION INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEDICAL OR VETERINARY SCIENCE PHYSICS SURGERY TESTING X-RAY TECHNIQUE
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Beschreibung
Zusammenfassung:	Computed tomography (CT) systems and related methods involving multi-target inspection are provided are provided. In this regard, a representative method includes: simultaneously directing X-rays toward multiple targets from an X-ray source; during the directing of the X-rays, independently reorienting the targets with respect to the X-ray source; and obtaining information corresponding to attenuation of the X-rays attributable to the multiple targets for producing computed tomography images of the targets.