Real-time, 3D, non-linear microscope measuring system and method for application of the same

A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photoche...

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Bibliographische Detailangaben
Hauptverfasser: ROZSA BALAZS, OSVAY KAROLY, VIZI SZILVESZTER E, KALLO PETER, SZIPOECS ROBERT, KATONA GERGELY, FEKETE JULIA, VALENTA LASZLO, MAAK PAL
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.