Particle detector

A particle detection device and method wherein a bulk sample of particles is selectively collected based on scattering properties of the particles and fluorescence properties of the particles. The bulk sample of particles is then excited to produce an atomic emission from the bulk sample of particle...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SICKENBERGER DAVID W, FOOT VIRGINIA E, PAYNE DEAN
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	A particle detection device and method wherein a bulk sample of particles is selectively collected based on scattering properties of the particles and fluorescence properties of the particles. The bulk sample of particles is then excited to produce an atomic emission from the bulk sample of particles. The atomic emission from the bulk sample of particles is used to determine atomic emission properties of the particles and identify biological particles in the bulk sample.