Methods for improving accuracy of measurement and calibration of accelerometer parameters

A method is disclosed in this invention for calibrating an offset Voffset and sensitivity Vsensitivity for an accelerometer implemented in a level gauge having a known value of an offset angle and a known value of a relative angle between top-and-bottom surface s. The method includes a step of placi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: LOU RUEY-DER
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method is disclosed in this invention for calibrating an offset Voffset and sensitivity Vsensitivity for an accelerometer implemented in a level gauge having a known value of an offset angle and a known value of a relative angle between top-and-bottom surface s. The method includes a step of placing the level gauge implemented with the accelerometer on a table-top surface having a tilt angle 1 and measuring a tilt angle F from the level gauge and an output voltage VF from the accelerometer, then rotating the level gauge 180 degrees on the table-top surface along a perpendicular axis relative to the table top surface and measuring a tilt angle B from the level gauge and measuring an output voltage VB from the accelerometer. Then, the method proceeds with a step of flipping the level gauge upside down on the table-top surface and measuring a tilt angle R from the level gauge and an output voltage VR from the accelerometer for calculating a tilt angle 1 of the table-top surface and the offset Voffset and sensitivity Vsensitivity of the accelerometer.