Methods for improving accuracy of measurement and calibration of accelerometer parameters
A method is disclosed in this invention for calibrating an offset Voffset and sensitivity Vsensitivity for an accelerometer implemented in a level gauge having a known value of an offset angle and a known value of a relative angle between top-and-bottom surface s. The method includes a step of placi...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A method is disclosed in this invention for calibrating an offset Voffset and sensitivity Vsensitivity for an accelerometer implemented in a level gauge having a known value of an offset angle and a known value of a relative angle between top-and-bottom surface s. The method includes a step of placing the level gauge implemented with the accelerometer on a table-top surface having a tilt angle 1 and measuring a tilt angle F from the level gauge and an output voltage VF from the accelerometer, then rotating the level gauge 180 degrees on the table-top surface along a perpendicular axis relative to the table top surface and measuring a tilt angle B from the level gauge and measuring an output voltage VB from the accelerometer. Then, the method proceeds with a step of flipping the level gauge upside down on the table-top surface and measuring a tilt angle R from the level gauge and an output voltage VR from the accelerometer for calculating a tilt angle 1 of the table-top surface and the offset Voffset and sensitivity Vsensitivity of the accelerometer. |
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