Fast time-of-flight mass spectrometer with improved dynamic range
Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
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| creator | VAUGHN VALERIE E ULRICH STEVEN R FUHRER KATRIN BURTON WILLIAM GONIN MARC SCHULTZ J. ALBERT EGAN THOMAS F |
| description | Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7800054B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7800054B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7800054B23</originalsourceid><addsrcrecordid>eNqNyjsKwkAQBuBtLES9w1xgYfGBtlEM9modhs2fZCH7YGdQvL2NB7D6mm9pmpZFSUOEzYMd5jBOSpFFSAq81hyhqPQOOlGIpeYXeuo_iWPwVDmNWJvFwLNg83NlqL0-LjeLkjtIYY8E7Z7348k5d9ift7s_yhe27TGZ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Fast time-of-flight mass spectrometer with improved dynamic range</title><source>esp@cenet</source><creator>VAUGHN VALERIE E ; ULRICH STEVEN R ; FUHRER KATRIN ; BURTON WILLIAM ; GONIN MARC ; SCHULTZ J. ALBERT ; EGAN THOMAS F</creator><creatorcontrib>VAUGHN VALERIE E ; ULRICH STEVEN R ; FUHRER KATRIN ; BURTON WILLIAM ; GONIN MARC ; SCHULTZ J. ALBERT ; EGAN THOMAS F</creatorcontrib><description>Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; BASIC ELECTRONIC CIRCUITRY ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; PULSE TECHNIQUE ; SEPARATION ; TRANSPORTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20100921&DB=EPODOC&CC=US&NR=7800054B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20100921&DB=EPODOC&CC=US&NR=7800054B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VAUGHN VALERIE E</creatorcontrib><creatorcontrib>ULRICH STEVEN R</creatorcontrib><creatorcontrib>FUHRER KATRIN</creatorcontrib><creatorcontrib>BURTON WILLIAM</creatorcontrib><creatorcontrib>GONIN MARC</creatorcontrib><creatorcontrib>SCHULTZ J. ALBERT</creatorcontrib><creatorcontrib>EGAN THOMAS F</creatorcontrib><title>Fast time-of-flight mass spectrometer with improved dynamic range</title><description>Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>PULSE TECHNIQUE</subject><subject>SEPARATION</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjsKwkAQBuBtLES9w1xgYfGBtlEM9modhs2fZCH7YGdQvL2NB7D6mm9pmpZFSUOEzYMd5jBOSpFFSAq81hyhqPQOOlGIpeYXeuo_iWPwVDmNWJvFwLNg83NlqL0-LjeLkjtIYY8E7Z7348k5d9ift7s_yhe27TGZ</recordid><startdate>20100921</startdate><enddate>20100921</enddate><creator>VAUGHN VALERIE E</creator><creator>ULRICH STEVEN R</creator><creator>FUHRER KATRIN</creator><creator>BURTON WILLIAM</creator><creator>GONIN MARC</creator><creator>SCHULTZ J. ALBERT</creator><creator>EGAN THOMAS F</creator><scope>EVB</scope></search><sort><creationdate>20100921</creationdate><title>Fast time-of-flight mass spectrometer with improved dynamic range</title><author>VAUGHN VALERIE E ; ULRICH STEVEN R ; FUHRER KATRIN ; BURTON WILLIAM ; GONIN MARC ; SCHULTZ J. ALBERT ; EGAN THOMAS F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7800054B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>PULSE TECHNIQUE</topic><topic>SEPARATION</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>VAUGHN VALERIE E</creatorcontrib><creatorcontrib>ULRICH STEVEN R</creatorcontrib><creatorcontrib>FUHRER KATRIN</creatorcontrib><creatorcontrib>BURTON WILLIAM</creatorcontrib><creatorcontrib>GONIN MARC</creatorcontrib><creatorcontrib>SCHULTZ J. ALBERT</creatorcontrib><creatorcontrib>EGAN THOMAS F</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VAUGHN VALERIE E</au><au>ULRICH STEVEN R</au><au>FUHRER KATRIN</au><au>BURTON WILLIAM</au><au>GONIN MARC</au><au>SCHULTZ J. ALBERT</au><au>EGAN THOMAS F</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Fast time-of-flight mass spectrometer with improved dynamic range</title><date>2010-09-21</date><risdate>2010</risdate><abstract>Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PULSE TECHNIQUE SEPARATION TRANSPORTING |
| title | Fast time-of-flight mass spectrometer with improved dynamic range |
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