Fast time-of-flight mass spectrometer with improved dynamic range

Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.

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Bibliographische Detailangaben
Hauptverfasser: VAUGHN VALERIE E, ULRICH STEVEN R, FUHRER KATRIN, BURTON WILLIAM, GONIN MARC, SCHULTZ J. ALBERT, EGAN THOMAS F
Format: Patent
Sprache:eng
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Zusammenfassung:Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.