System and method for automated inspection of large-scale part

Systems and methods can automatically inspect a workpiece. Non-destructive inspection sensors are mounted on a frame mounted on a transport device. Position of a first predetermined location of a workpiece is measured with a tracking system. The transport device is moved to position the non-destruct...

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Bibliographische Detailangaben
Hauptverfasser:	MARSH BOBBY J, BODZIONY LEONARD S, VANSCOTTER KINSON D, GEORGESON GARY E
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Systems and methods can automatically inspect a workpiece. Non-destructive inspection sensors are mounted on a frame mounted on a transport device. Position of a first predetermined location of a workpiece is measured with a tracking system. The transport device is moved to position the non-destructive inspection sensors proximate the first predetermined location of a workpiece. A first portion of a workpiece proximate the first predetermined location is non-destructively inspected with the non-destructive inspection sensors. Position of a second predetermined location of a workpiece can be measured with the tracking system. The transport device can be moved to position the non-destructive inspection sensors proximate the second predetermined location of a workpiece, and a second portion of a workpiece proximate the second predetermined location can be non-destructively inspected with the non-destructive inspection sensors. Data can be provided from the sensors to a computing system and analyzed by the computing system.