Pattern generation for test apparatus and electronic device

There is provided a test apparatus for testing a device under test. The test apparatus includes a main instruction storing section that stores thereon a main test instruction sequence, a sub instruction storing section that stores thereon a sub test instruction sequence which is executed when a subroutine call instruction included in the main test instruction sequence is executed, a pattern generating section that (i) sequentially reads and executes an instruction from the main test instruction sequence and outputs (I) a test pattern associated with the executed instruction and (II) timing set information designating a combination of timings for output of the test pattern, (ii) under a condition of executing the subroutine call instruction, sequentially reads and executes an instruction from the sub test instruction sequence designated by the executed subroutine call instruction and outputs (1) a test pattern associated with the executed instruction and (2) timing set information for a test pattern associated with the subroutine call instruction or an instruction which precedes the subroutine call instruction in the main test instruction sequence, and a test signal output section that generates a test signal in accordance with the test pattern, and supplies the test signal to the device under test at a timing designated by the timing set information.