Method of forming a semiconductor structure comprising insulating layers with different thicknesses

The method of forming a semiconductor structure in a substrate comprises, forming a first trench with a first width We and a second trench with a second width Wc, wherein the first width We is larger than the second width Wc, depositing a protection material, lining the first trench, covering the su...

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Hauptverfasser: VANNUCCI NICOLA, MAIER HUBERT
Format: Patent
Sprache:eng
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Zusammenfassung:The method of forming a semiconductor structure in a substrate comprises, forming a first trench with a first width We and a second trench with a second width Wc, wherein the first width We is larger than the second width Wc, depositing a protection material, lining the first trench, covering the substrate surface and filling the second trench and removing partially the protection material, wherein a lower portion of the second trench remains filled with the protection material.