Testing of an embedded multiplexer having a plurality of inputs
Functional testing of an integrated circuit (IC) is a part from a more comprehensive and thorough testing. An IC including an embedded select circuit module coupled to receive numerous input signals. The IC may also include control circuit coupled to receive input control signals, where at least one...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | Functional testing of an integrated circuit (IC) is a part from a more comprehensive and thorough testing. An IC including an embedded select circuit module coupled to receive numerous input signals. The IC may also include control circuit coupled to receive input control signals, where at least one input control signal of the input control signals is a mode signal. Asserting the mode signal may operate the select circuit module in a test mode. |
|---|