Method of testing a sequential access memory plane and a corresponding sequential access memory semiconductor device
The sequential access memory array is able to store p words each of n bits. Such p test words each made up of n test bits are written in the memory array, the p test words are extracted sequentially and, for each current word extracted, the n test bits that compose it are compared sequentially with...
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| Format: | Patent |
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| Zusammenfassung: | The sequential access memory array is able to store p words each of n bits. Such p test words each made up of n test bits are written in the memory array, the p test words are extracted sequentially and, for each current word extracted, the n test bits that compose it are compared sequentially with n respective expected data bits before extracting the next test word. |
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