Testing of input/output devices of an integrated circuit

Testing of input/output devices of an integrated circuit

Method and apparatus for testing input/output circuits of an integrated circuit are described. An integrated circuit includes input/output circuits having input/output pads. The input/output pads are capable of being coupled together to a tester channel. The input/output circuits each are configurab...

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Hauptverfasser: LAKKAPRAGADA SHANKAR, SIMMONS RANDY J, SIMMONS TUYET NGOC, LAI ANDREW W, NGUYEN ANDY T
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PULSE TECHNIQUE
TESTING
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Beschreibung
Zusammenfassung:Method and apparatus for testing input/output circuits of an integrated circuit are described. An integrated circuit includes input/output circuits having input/output pads. The input/output pads are capable of being coupled together to a tester channel. The input/output circuits each are configurable via configuration circuitry to be in either a first mode or a second mode responsive to a select circuit of the configuration circuitry coupled to receive a first input for the first mode and a second input for the second mode. The select circuit is controlled responsive to a control select signal common to all or a portion of the select circuits of each of the input/output circuits.