Manufacturing method of display device

A manufacturing method of a display device, which prevents electrostatic breakdown of the display device both before and after a circuit test without reducing the productivity in forming a plurality of display devices on a substrate to be processed by a step-and-repeat exposing method. A wiring patt...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	IWABUCHI TOMOYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING BASIC ELECTRIC ELEMENTS CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY DISPLAYING EDUCATION ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FREQUENCY-CHANGING LABELS OR NAME-PLATES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS SEMICONDUCTOR DEVICES SIGNS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A manufacturing method of a display device, which prevents electrostatic breakdown of the display device both before and after a circuit test without reducing the productivity in forming a plurality of display devices on a substrate to be processed by a step-and-repeat exposing method. A wiring pattern group led out from signal input terminals of the display devices to the edge of the substrate to be processed is efficiently formed by exposing to light through a repetitive pattern integrated with a display device pattern. Depending on the states of the wiring pattern group as to contact or non-contact with a detachable and conductive component, the signal input terminals of the display devices can be easily switched between in a short circuited state and a non-short circuited state. Accordingly, both the measure against electrostatic breakdown and the circuit test are achieved in the display devices on the substrate to be processed.