Probe holder for various thickness substrates

Probe holder for various thickness substrates

A probe holder for a signal acquisition probe has a cradle receiving the signal acquisition probe and a pedestal adapted for receiving substrates of various thicknesses. The pedestal has a base member and an upright member with the upright member coupled to the cradle. The base member has at least a...

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1. Verfasser: STEVENS KERRY A
Format: Patent
Sprache:eng
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ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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creator STEVENS KERRY A
description A probe holder for a signal acquisition probe has a cradle receiving the signal acquisition probe and a pedestal adapted for receiving substrates of various thicknesses. The pedestal has a base member and an upright member with the upright member coupled to the cradle. The base member has at least a first lateral slot formed therein having a plurality of clearances for receiving substrates of varying thicknesses.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7526972B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7526972B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7526972B23</originalsourceid><addsrcrecordid>eNrjZNANKMpPSlXIyM9JSS1SSMsvUihLLMrMLy1WKMnITM7OSy0uViguTSouKUosSS3mYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocHmpkZmluZGTkbGRCgBAKLcKnQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Probe holder for various thickness substrates</title><source>esp@cenet</source><creator>STEVENS KERRY A</creator><creatorcontrib>STEVENS KERRY A</creatorcontrib><description>A probe holder for a signal acquisition probe has a cradle receiving the signal acquisition probe and a pedestal adapted for receiving substrates of various thicknesses. The pedestal has a base member and an upright member with the upright member coupled to the cradle. The base member has at least a first lateral slot formed therein having a plurality of clearances for receiving substrates of varying thicknesses.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090505&amp;DB=EPODOC&amp;CC=US&amp;NR=7526972B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090505&amp;DB=EPODOC&amp;CC=US&amp;NR=7526972B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STEVENS KERRY A</creatorcontrib><title>Probe holder for various thickness substrates</title><description>A probe holder for a signal acquisition probe has a cradle receiving the signal acquisition probe and a pedestal adapted for receiving substrates of various thicknesses. The pedestal has a base member and an upright member with the upright member coupled to the cradle. The base member has at least a first lateral slot formed therein having a plurality of clearances for receiving substrates of varying thicknesses.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNANKMpPSlXIyM9JSS1SSMsvUihLLMrMLy1WKMnITM7OSy0uViguTSouKUosSS3mYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocHmpkZmluZGTkbGRCgBAKLcKnQ</recordid><startdate>20090505</startdate><enddate>20090505</enddate><creator>STEVENS KERRY A</creator><scope>EVB</scope></search><sort><creationdate>20090505</creationdate><title>Probe holder for various thickness substrates</title><author>STEVENS KERRY A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7526972B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>STEVENS KERRY A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STEVENS KERRY A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Probe holder for various thickness substrates</title><date>2009-05-05</date><risdate>2009</risdate><abstract>A probe holder for a signal acquisition probe has a cradle receiving the signal acquisition probe and a pedestal adapted for receiving substrates of various thicknesses. The pedestal has a base member and an upright member with the upright member coupled to the cradle. The base member has at least a first lateral slot formed therein having a plurality of clearances for receiving substrates of varying thicknesses.</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title Probe holder for various thickness substrates
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T01%3A22%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=STEVENS%20KERRY%20A&rft.date=2009-05-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7526972B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true