Probe holder for various thickness substrates

A probe holder for a signal acquisition probe has a cradle receiving the signal acquisition probe and a pedestal adapted for receiving substrates of various thicknesses. The pedestal has a base member and an upright member with the upright member coupled to the cradle. The base member has at least a...

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Bibliographische Detailangaben
1. Verfasser:	STEVENS KERRY A
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A probe holder for a signal acquisition probe has a cradle receiving the signal acquisition probe and a pedestal adapted for receiving substrates of various thicknesses. The pedestal has a base member and an upright member with the upright member coupled to the cradle. The base member has at least a first lateral slot formed therein having a plurality of clearances for receiving substrates of varying thicknesses.