Method and apparatus for monitoring and controlling the thermal environment and operating conditions of an integrated circuit

Logic included in an IC monitors values of parameters that may affect operation of the IC, such as, for example, supply voltage (VDD), junction temperature (TJUNC) and the frequency of a ring oscillator on the IC. In response to the monitored values, the logic in the IC changes, if necessary, one or...

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Bibliographische Detailangaben

1. Verfasser:	WALD STEVEN F
Format:	Patent
Sprache:	eng
Schlagworte:	CONTROLLING PHYSICS REGULATING SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
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