Method and apparatus for monitoring and controlling the thermal environment and operating conditions of an integrated circuit

Logic included in an IC monitors values of parameters that may affect operation of the IC, such as, for example, supply voltage (VDD), junction temperature (TJUNC) and the frequency of a ring oscillator on the IC. In response to the monitored values, the logic in the IC changes, if necessary, one or more parameters such as VDD, processor frequency (FCLK), and/or cooling level to control the performance of the IC. Thus, the IC monitors its own environment and operating conditions and takes appropriate steps to control its environment and operating conditions to achieve certain goals.