Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit

Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit

A method and apparatus time-division demultiplexes and decompresses a compressed input stimulus provided at a selected data rate R1, into a decompressed stimulus, driven at a selected data rate R2, for driving selected scan chains in a scan-based integrated circuit using a plurality of time-division...

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Bibliographische Detailangaben
Hauptverfasser: HSU FEI-SHENG, SHEU BORYAU (JACK), LIN SHYH-HORNG, WEN XIAOQING, CHANG MING-TUNG, KIFLI AUGUSLI, WU SHIANLING, WANG SHUN-MIIN (SAM), ABDEL-HAFEZ KHADER S, WANG LAUNG-TERNG
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRIC DIGITAL DATA PROCESSING
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MULTIPLEX COMMUNICATION
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method and apparatus time-division demultiplexes and decompresses a compressed input stimulus provided at a selected data rate R1, into a decompressed stimulus, driven at a selected data rate R2, for driving selected scan chains in a scan-based integrated circuit using a plurality of time-division demultiplexors and time-division multiplexors for shifting stimuli and test responses in and out of high-speed I/O pads in order to reduce test time, test cost, and scan pin count. A synthesis method is also proposed for synthesizing the time-division multiplexors, decompressors, compressors, and time-division multiplexors.