Optical metrology system

An optical metrology system having an optical metrology sensor assembly and a target is disclosed. The optical metrology sensor assembly transmits a light beam to the target and then uses the reflected beam from the target to determine the position of the target in three dimensions. The optical metr...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	MASSEY CAMERON G, BARVOSA-CARTER WILLIAM, DOTY ROBERT, HERRERA GUILLERMO, NOLAN MICHAEL, BRUESSELBACH HANS
Format:	Patent
Sprache:	eng
Schlagworte:	ANALOGOUS ARRANGEMENTS USING OTHER WAVES DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIO DIRECTION-FINDING RADIO NAVIGATION TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	An optical metrology system having an optical metrology sensor assembly and a target is disclosed. The optical metrology sensor assembly transmits a light beam to the target and then uses the reflected beam from the target to determine the position of the target in three dimensions. The optical metrology sensor can comprise a light source, a ranging device, and a two-dimensional sensor. The optical metrology system is suitable for applications such as determining the position, orientation, and shape of a spacecraft antenna, so as to facilitate movement thereof to enhance operation of the antenna.