Dynamic on-chip logic analysis

An apparatus and a method for analyzing signals within an integrated circuit are described. In one embodiment of the present invention, internal IC signals are tapped, sampled and stored according to one or more sampling criteria. The signals may be taken from multiple locations within the IC and th...

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Bibliographische Detailangaben
Hauptverfasser:	WHITT JEFFERY K, OLSON STEVE A, BROWEN ADAM S, CHAFIN CRAIG
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NUCLEAR ENGINEERING NUCLEAR PHYSICS NUCLEAR REACTORS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An apparatus and a method for analyzing signals within an integrated circuit are described. In one embodiment of the present invention, internal IC signals are tapped, sampled and stored according to one or more sampling criteria. The signals may be taken from multiple locations within the IC and the information stored may include data, timing information, control data and other such information related to the tapped signals. The stored information may be provided to an external device for analysis.