Method for simulating a process plant at laboratory scale

A method, a laboratory device and the use of both are provided for simulating the dynamic temperature behavior of at least one part of a process plant, particularly an industrial reactor. The method provides a temperature profile and/or temperature setpoints at given time intervals for controlling t...

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Bibliographische Detailangaben
Hauptverfasser:	GROTH URS, STOESSEL FRANCIS, ZUFFEREY BENOIT
Format:	Patent
Sprache:	eng
Schlagworte:	ANALOGUE COMPUTERS CALCULATING COMPUTING COUNTING MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A method, a laboratory device and the use of both are provided for simulating the dynamic temperature behavior of at least one part of a process plant, particularly an industrial reactor. The method provides a temperature profile and/or temperature setpoints at given time intervals for controlling the laboratory device. The temperature profile and/or temperature setpoints are derived from a mathematical model that describes the dynamic temperature behavior of at least one part of the process plant. The temperature profile and/or the temperature setpoints are used by a program for controlling the laboratory device.