Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit

Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit

The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream (23), a programmable digital line emulator (TPE1) for emulating properties of a transmission path and an output for emitting an analog data stream (24) having a signal-to-noise ratio w...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SATTLER SEBASTIAN, MATTES HEINZ
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream (23), a programmable digital line emulator (TPE1) for emulating properties of a transmission path and an output for emitting an analog data stream (24) having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator (TPE1).