Apparatus, system, and method for modifying memory voltage and performance based on a measure of memory device stress

An apparatus, system, and method are disclosed for modifying memory device timing and voltage. A detection module detects a change of memory device stress. A timing modification module modifies the memory device timing in response to the change of the memory device stress. In addition, a voltage mod...

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Hauptverfasser:	ROUMBAKIS MENAS, PHAM NAM HUU, CASES MOISES, DE ARAUJO DANIEL N
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE PHYSICS PULSE TECHNIQUE STATIC STORES
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creator	ROUMBAKIS MENAS PHAM NAM HUU CASES MOISES DE ARAUJO DANIEL N
description	An apparatus, system, and method are disclosed for modifying memory device timing and voltage. A detection module detects a change of memory device stress. A timing modification module modifies the memory device timing in response to the change of the memory device stress. In addition, a voltage modification module modifies the memory device voltage in response to the change of the memory device stress. In one embodiment, a processor pause module pauses the operation of a processor module while the timing modification module modifies the memory device timing and the voltage modification module modifies the memory device voltage.
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A detection module detects a change of memory device stress. A timing modification module modifies the memory device timing in response to the change of the memory device stress. In addition, a voltage modification module modifies the memory device voltage in response to the change of the memory device stress. In one embodiment, a processor pause module pauses the operation of a processor module while the timing modification module modifies the memory device timing and the voltage modification module modifies the memory device voltage.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; INFORMATION STORAGE ; PHYSICS ; PULSE TECHNIQUE ; STATIC STORES</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081028&DB=EPODOC&CC=US&NR=7444490B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081028&DB=EPODOC&CC=US&NR=7444490B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ROUMBAKIS MENAS</creatorcontrib><creatorcontrib>PHAM NAM HUU</creatorcontrib><creatorcontrib>CASES MOISES</creatorcontrib><creatorcontrib>DE ARAUJO DANIEL N</creatorcontrib><title>Apparatus, system, and method for modifying memory voltage and performance based on a measure of memory device stress</title><description>An apparatus, system, and method are disclosed for modifying memory device timing and voltage. 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A detection module detects a change of memory device stress. A timing modification module modifies the memory device timing in response to the change of the memory device stress. In addition, a voltage modification module modifies the memory device voltage in response to the change of the memory device stress. In one embodiment, a processor pause module pauses the operation of a processor module while the timing modification module modifies the memory device timing and the voltage modification module modifies the memory device voltage.</abstract><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE PHYSICS PULSE TECHNIQUE STATIC STORES
title	Apparatus, system, and method for modifying memory voltage and performance based on a measure of memory device stress
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