Apparatus, system, and method for modifying memory voltage and performance based on a measure of memory device stress

An apparatus, system, and method are disclosed for modifying memory device timing and voltage. A detection module detects a change of memory device stress. A timing modification module modifies the memory device timing in response to the change of the memory device stress. In addition, a voltage mod...

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Bibliographische Detailangaben
Hauptverfasser:	ROUMBAKIS MENAS, PHAM NAM HUU, CASES MOISES, DE ARAUJO DANIEL N
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE PHYSICS PULSE TECHNIQUE STATIC STORES
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Beschreibung
Zusammenfassung:	An apparatus, system, and method are disclosed for modifying memory device timing and voltage. A detection module detects a change of memory device stress. A timing modification module modifies the memory device timing in response to the change of the memory device stress. In addition, a voltage modification module modifies the memory device voltage in response to the change of the memory device stress. In one embodiment, a processor pause module pauses the operation of a processor module while the timing modification module modifies the memory device timing and the voltage modification module modifies the memory device voltage.