Method and apparatus for discharging voltages from a circuit under test

In one embodiment, voltages are discharged from a circuit under test by, after pins of a circuit tester have been coupled to nodes of the circuit under test, making a first one of the pins an active pin and executing a current discharge process for the active pin. The current discharge process couples a current discharge circuit to the active pin, and then enables the current discharge circuit. A voltage of the active pin is then measured and, if the measured voltage is within a defined window, the active pin is coupled to ground. However, if the measured voltage is outside of the defined window after the current discharge circuit has been enabled for a predetermined period of time, the active pin is marked as not discharged. The current discharge circuit is then disabled and decoupled from the active pin. Thereafter, a next one of the pins is made the active pin, and the current discharge process is caused to be repeated.