Automatic test program generation method

Automatic test program generation method

Architecturally complicated computers require functionally complicated compiler. For such a compiler, the present invention provides an automatic compiler test program generation method capable of reducing the man-hour required to prepare a test program and testing many aspects of the compiler. By a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KAGEYAMA NAOHIRO, HIROSE ZENTARO, KAWAUCHI MICHIYUKI, FUKUMA TAKESHI
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
ELECTRICITY
EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
GENERATION
PHYSICS
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Beschreibung
Zusammenfassung:Architecturally complicated computers require functionally complicated compiler. For such a compiler, the present invention provides an automatic compiler test program generation method capable of reducing the man-hour required to prepare a test program and testing many aspects of the compiler. By a random number-used method, a plurality of program cells are selected from a set of program cells each of which may form an element of a test program. The selected program cells are combined into a test program.