Scanning device for scanning a scale graduation, and position measuring system utilizing the same

A scanning device for scanning a scale graduation for detecting relative movements of the scanning device with respect to the scale graduation. The scanning device includes a first primary sensor field and a second primary sensor field used for detecting relative movements along a first spatial dire...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	MATZ MANFRED, BURGSCHAT REINER
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A scanning device for scanning a scale graduation for detecting relative movements of the scanning device with respect to the scale graduation. The scanning device includes a first primary sensor field and a second primary sensor field used for detecting relative movements along a first spatial direction. A first secondary sensor field and a second secondary sensor field for detecting relative movements along a second spatial direction, which is linearly independent of the first spatial direction. The first primary sensor field, the second primary sensor field, the first secondary sensor field and the second secondary sensor field are arranged point-symmetrically in relation to a mid-point in a plane.