Method for detecting lateral surface charge migration through double exposure averaging

Method for detecting lateral surface charge migration through double exposure averaging

The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, th...

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Bibliographische Detailangaben
Hauptverfasser: HINCKEL M. JOHN, MISHRA SATCHIDANAND, DOMM EDWARD, JEYADEV SURENDAR, MARKOVICS JAMES M, SILVESTRI MARKUS RUDOLF
Format: Patent
Sprache:eng
Schlagworte:
CINEMATOGRAPHY
ELECTROGRAPHY
ELECTROPHOTOGRAPHY
HOLOGRAPHY
MAGNETOGRAPHY
PHOTOGRAPHY
PHYSICS
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Beschreibung
Zusammenfassung:The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, the surface is exposed a second time to the image. After another waiting period, the average potential is measured. The amount of LCM may be quantified by varying the waiting periods.