System for metric introspection in monitoring sources

System for metric introspection in monitoring sources

According to one embodiment, a method comprises storing metric definitions for at least one monitored component in a machine-readable format to a data storage device. The method further comprises enabling access by at least one monitoring tool to the metric definitions via a metric introspection int...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: GRAUPNER SVEN, FARKAS KEITH I, ARLITT MARTIN F, ROLIA JEROME
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:According to one embodiment, a method comprises storing metric definitions for at least one monitored component in a machine-readable format to a data storage device. The method further comprises enabling access by at least one monitoring tool to the metric definitions via a metric introspection interface. The method further comprises the at least one monitoring tool autonomously comprehending the metric definitions for use in processing monitoring data collected for the at least one monitored component.