Device for measuring impedance of electronic component

A device measures an impedance of an electronic component with using an impedance measuring apparatus. The impedance measuring device includes first and second probes to be connected to measuring terminals of the impedance measuring apparatus, an anisotropic conductive sheet, and a pressing member for pressing the electronic component toward the first and second probes. The first probe has a first contact surface. The second probe has a second contact surface flush with the first contact surface. The anisotropic conductive sheet has a first surface contacting the first and second contact surface, and a second surface opposite to the first surface. The pressing member causes first and second external terminals of the electronic component to contact the anisotropic conductive sheet. The conductive sheet includes an insulating elastic sheet and plural conductive wires penetrating the elastic sheet to expose from the first surface and the second surface. The conductive wires electrically connect the first and second external terminals to the first and second contact surfaces, respectively.