Fast plant test for model-based control

A method and apparatus for designing perturbation signals to excite a number of input variables of a system, in order to test that system for the purpose of obtaining models for the synthesis of a model-based controller. The method begins with providing input parameters of the system. A plurality of...

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Bibliographische Detailangaben
Hauptverfasser:	KOTHARE SIMONE L, MANDLER JORGE ANIBAL
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY FUNCTIONAL ELEMENTS OF SUCH SYSTEMS INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT MEASURING MEASURING ELECTRIC VARIABLES MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS PULSE TECHNIQUE REGULATING SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR TARIFF METERING APPARATUS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A method and apparatus for designing perturbation signals to excite a number of input variables of a system, in order to test that system for the purpose of obtaining models for the synthesis of a model-based controller. The method begins with providing input parameters of the system. A plurality of binary multi-frequency (BMF) signals are generated based on these input parameters and the frequency spectra of these BMF signals are calculated. One BMF signal is selected out of the set of BMF signals so that the frequency spectrum of the selected BMF signal most closely matches a desired frequency spectrum specified by the input parameters. The selected BMF signal is used as a first perturbation signal for testing the system. The selected BMF signal is also shifted by predetermined amounts of samples to create delayed copies of the original BMF signal to be used as additional perturbation signals.