System and method for predicting component failures in large systems

A method for predicting a time to failure of a component in a system is presented. The method comprises obtaining a set of data measurements related to the component. The set of data measurements are representative of a plurality of parameters including a plurality of leading parameters. The method...

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Bibliographische Detailangaben
Hauptverfasser:	RAJIV VRINDA, OSBORN MARK DAVID, ASATI MAHESH KUMAR, BONISSONE PIERO PATRONE, SHAH RASIKLAL PUNJALAL
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A method for predicting a time to failure of a component in a system is presented. The method comprises obtaining a set of data measurements related to the component. The set of data measurements are representative of a plurality of parameters including a plurality of leading parameters. The method comprises generating a prediction model based upon the leading parameters considered in combination. The prediction model is then used to predict the time to failure of the component based on a set of real-time measurements, wherein the plurality of parameters are processed to predict the time to failure for the component. Finally, a confidence level for the predicted time to failure is determined based upon the plurality of parameters.