Attachable/detachable probing tip system for a measurement probing system

Attachable/detachable probing tip system for a measurement probing system

A attachable/detachable probing tip system ( 10 ) has a housing ( 12 ) that includes a probing tip mounting member ( 14 ) and opposing substantially orthogonal attachment ( 16, 18 ) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mo...

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Hauptverfasser: MARTIN JIM L, GESSFORD MARC A, POOLEY WILLIAM R, POLLOCK IRA G, LAW WILLIAM Q, HAGERUP WILLIAM A
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRICITY
LINE CONNECTORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator MARTIN JIM L
GESSFORD MARC A
POOLEY WILLIAM R
POLLOCK IRA G
LAW WILLIAM Q
HAGERUP WILLIAM A
description A attachable/detachable probing tip system ( 10 ) has a housing ( 12 ) that includes a probing tip mounting member ( 14 ) and opposing substantially orthogonal attachment ( 16, 18 ) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member ( 56 ). First and second probing tips ( 42, 44 ) are disposed over the non-compressive, resilient member ( 56 ) and secured to the housing by latching means ( 60, 66, 92, 96, 100, 130 ). The attachable/detachable probing tip system allows mounting of the probing tips ( 42, 44 ) to probing contacts on a device under test without a probe body or probing tip member ( 38 ) being attached. The attachment arms ( 16, 18 ) allows a probe body or probing tip member ( 38 ) to be attached and detached to the probing tip system ( 10 ). The probing tip member ( 38 ) includes contact pins that engage contact areas ( 82, 82, 92 ) of the probing tips ( 42, 44 ).
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7056134B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7056134B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7056134B23</originalsourceid><addsrcrecordid>eNrjZPB0LClJTM5ITMpJ1U9JhTEVCorykzLz0hVKMgsUiiuLS1JzFdLyixQSFXJTE4tLi1JzU_NK4IogCngYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSXxosLmBqZmhsYmTkTERSgCoIzTS</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Attachable/detachable probing tip system for a measurement probing system</title><source>esp@cenet</source><creator>MARTIN JIM L ; GESSFORD MARC A ; POOLEY WILLIAM R ; POLLOCK IRA G ; LAW WILLIAM Q ; HAGERUP WILLIAM A</creator><creatorcontrib>MARTIN JIM L ; GESSFORD MARC A ; POOLEY WILLIAM R ; POLLOCK IRA G ; LAW WILLIAM Q ; HAGERUP WILLIAM A</creatorcontrib><description>A attachable/detachable probing tip system ( 10 ) has a housing ( 12 ) that includes a probing tip mounting member ( 14 ) and opposing substantially orthogonal attachment ( 16, 18 ) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member ( 56 ). First and second probing tips ( 42, 44 ) are disposed over the non-compressive, resilient member ( 56 ) and secured to the housing by latching means ( 60, 66, 92, 96, 100, 130 ). The attachable/detachable probing tip system allows mounting of the probing tips ( 42, 44 ) to probing contacts on a device under test without a probe body or probing tip member ( 38 ) being attached. The attachment arms ( 16, 18 ) allows a probe body or probing tip member ( 38 ) to be attached and detached to the probing tip system ( 10 ). The probing tip member ( 38 ) includes contact pins that engage contact areas ( 82, 82, 92 ) of the probing tips ( 42, 44 ).</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CURRENT COLLECTORS ; ELECTRICITY ; LINE CONNECTORS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060606&amp;DB=EPODOC&amp;CC=US&amp;NR=7056134B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060606&amp;DB=EPODOC&amp;CC=US&amp;NR=7056134B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MARTIN JIM L</creatorcontrib><creatorcontrib>GESSFORD MARC A</creatorcontrib><creatorcontrib>POOLEY WILLIAM R</creatorcontrib><creatorcontrib>POLLOCK IRA G</creatorcontrib><creatorcontrib>LAW WILLIAM Q</creatorcontrib><creatorcontrib>HAGERUP WILLIAM A</creatorcontrib><title>Attachable/detachable probing tip system for a measurement probing system</title><description>A attachable/detachable probing tip system ( 10 ) has a housing ( 12 ) that includes a probing tip mounting member ( 14 ) and opposing substantially orthogonal attachment ( 16, 18 ) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member ( 56 ). First and second probing tips ( 42, 44 ) are disposed over the non-compressive, resilient member ( 56 ) and secured to the housing by latching means ( 60, 66, 92, 96, 100, 130 ). The attachable/detachable probing tip system allows mounting of the probing tips ( 42, 44 ) to probing contacts on a device under test without a probe body or probing tip member ( 38 ) being attached. The attachment arms ( 16, 18 ) allows a probe body or probing tip member ( 38 ) to be attached and detached to the probing tip system ( 10 ). The probing tip member ( 38 ) includes contact pins that engage contact areas ( 82, 82, 92 ) of the probing tips ( 42, 44 ).</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CURRENT COLLECTORS</subject><subject>ELECTRICITY</subject><subject>LINE CONNECTORS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPB0LClJTM5ITMpJ1U9JhTEVCorykzLz0hVKMgsUiiuLS1JzFdLyixQSFXJTE4tLi1JzU_NK4IogCngYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSXxosLmBqZmhsYmTkTERSgCoIzTS</recordid><startdate>20060606</startdate><enddate>20060606</enddate><creator>MARTIN JIM L</creator><creator>GESSFORD MARC A</creator><creator>POOLEY WILLIAM R</creator><creator>POLLOCK IRA G</creator><creator>LAW WILLIAM Q</creator><creator>HAGERUP WILLIAM A</creator><scope>EVB</scope></search><sort><creationdate>20060606</creationdate><title>Attachable/detachable probing tip system for a measurement probing system</title><author>MARTIN JIM L ; GESSFORD MARC A ; POOLEY WILLIAM R ; POLLOCK IRA G ; LAW WILLIAM Q ; HAGERUP WILLIAM A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7056134B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CURRENT COLLECTORS</topic><topic>ELECTRICITY</topic><topic>LINE CONNECTORS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MARTIN JIM L</creatorcontrib><creatorcontrib>GESSFORD MARC A</creatorcontrib><creatorcontrib>POOLEY WILLIAM R</creatorcontrib><creatorcontrib>POLLOCK IRA G</creatorcontrib><creatorcontrib>LAW WILLIAM Q</creatorcontrib><creatorcontrib>HAGERUP WILLIAM A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MARTIN JIM L</au><au>GESSFORD MARC A</au><au>POOLEY WILLIAM R</au><au>POLLOCK IRA G</au><au>LAW WILLIAM Q</au><au>HAGERUP WILLIAM A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Attachable/detachable probing tip system for a measurement probing system</title><date>2006-06-06</date><risdate>2006</risdate><abstract>A attachable/detachable probing tip system ( 10 ) has a housing ( 12 ) that includes a probing tip mounting member ( 14 ) and opposing substantially orthogonal attachment ( 16, 18 ) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member ( 56 ). First and second probing tips ( 42, 44 ) are disposed over the non-compressive, resilient member ( 56 ) and secured to the housing by latching means ( 60, 66, 92, 96, 100, 130 ). The attachable/detachable probing tip system allows mounting of the probing tips ( 42, 44 ) to probing contacts on a device under test without a probe body or probing tip member ( 38 ) being attached. The attachment arms ( 16, 18 ) allows a probe body or probing tip member ( 38 ) to be attached and detached to the probing tip system ( 10 ). The probing tip member ( 38 ) includes contact pins that engage contact areas ( 82, 82, 92 ) of the probing tips ( 42, 44 ).</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRICITY
LINE CONNECTORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Attachable/detachable probing tip system for a measurement probing system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T11%3A22%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MARTIN%20JIM%20L&rft.date=2006-06-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7056134B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true