Attachable/detachable probing tip system for a measurement probing system

A attachable/detachable probing tip system ( 10 ) has a housing ( 12 ) that includes a probing tip mounting member ( 14 ) and opposing substantially orthogonal attachment ( 16, 18 ) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mo...

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Hauptverfasser: MARTIN JIM L, GESSFORD MARC A, POOLEY WILLIAM R, POLLOCK IRA G, LAW WILLIAM Q, HAGERUP WILLIAM A
Format: Patent
Sprache:eng
Schlagworte:
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Zusammenfassung:A attachable/detachable probing tip system ( 10 ) has a housing ( 12 ) that includes a probing tip mounting member ( 14 ) and opposing substantially orthogonal attachment ( 16, 18 ) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member ( 56 ). First and second probing tips ( 42, 44 ) are disposed over the non-compressive, resilient member ( 56 ) and secured to the housing by latching means ( 60, 66, 92, 96, 100, 130 ). The attachable/detachable probing tip system allows mounting of the probing tips ( 42, 44 ) to probing contacts on a device under test without a probe body or probing tip member ( 38 ) being attached. The attachment arms ( 16, 18 ) allows a probe body or probing tip member ( 38 ) to be attached and detached to the probing tip system ( 10 ). The probing tip member ( 38 ) includes contact pins that engage contact areas ( 82, 82, 92 ) of the probing tips ( 42, 44 ).