Voltage probe systems having improved bandwidth capability

A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under tes...

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1. Verfasser:	DASCHER DAVID J
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RESISTORS TESTING
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creator	DASCHER DAVID J
description	A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under test.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7053750B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7053750B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7053750B23</originalsourceid><addsrcrecordid>eNrjZLAKy88pSUxPVSgoyk9KVSiuLC5JzS1WyEgsy8xLV8jMBQqXpaYoJCXmpZRnppRkKCQnFiQmZeZkllTyMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JL40GBzA1Njc1MDJyNjIpQAAGFVL2U</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Voltage probe systems having improved bandwidth capability</title><source>esp@cenet</source><creator>DASCHER DAVID J</creator><creatorcontrib>DASCHER DAVID J</creatorcontrib><description>A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under test.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; RESISTORS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060530&DB=EPODOC&CC=US&NR=7053750B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060530&DB=EPODOC&CC=US&NR=7053750B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DASCHER DAVID J</creatorcontrib><title>Voltage probe systems having improved bandwidth capability</title><description>A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under test.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>RESISTORS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAKy88pSUxPVSgoyk9KVSiuLC5JzS1WyEgsy8xLV8jMBQqXpaYoJCXmpZRnppRkKCQnFiQmZeZkllTyMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JL40GBzA1Njc1MDJyNjIpQAAGFVL2U</recordid><startdate>20060530</startdate><enddate>20060530</enddate><creator>DASCHER DAVID J</creator><scope>EVB</scope></search><sort><creationdate>20060530</creationdate><title>Voltage probe systems having improved bandwidth capability</title><author>DASCHER DAVID J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7053750B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>RESISTORS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DASCHER DAVID J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DASCHER DAVID J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Voltage probe systems having improved bandwidth capability</title><date>2006-05-30</date><risdate>2006</risdate><abstract>A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under test.</abstract><oa>free_for_read</oa></addata></record>
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language	eng
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subjects	BASIC ELECTRIC ELEMENTS ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RESISTORS TESTING
title	Voltage probe systems having improved bandwidth capability
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T05%3A21%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DASCHER%20DAVID%20J&rft.date=2006-05-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7053750B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true