Voltage probe systems having improved bandwidth capability

Voltage probe systems having improved bandwidth capability

A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under tes...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: DASCHER DAVID J
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
RESISTORS
TESTING
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Beschreibung
Zusammenfassung:A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under test.