Mask network design for scan-based integrated circuits

A method and apparatus for selectively masking off unknown ('x') captured scan data in first selected scan cells 220 from propagating through the scan chains 221 for test, debug, diagnosis, and yield improvement of a scan-based integrated circuit 207 in a selected scan-test mode 232 or sel...

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Bibliographische Detailangaben

Hauptverfasser:	WANG LAUNG-TERNG (L.-T.), SHEU BORYAU (JACK), WEN XIAOQING, WANG SHUN-MIIN (SAM), ABDEL-HAFEZ KHADER S
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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