Method and device for evaluating charge potential
In a charge potential evaluation device, the measured value of a potential difference Vc in a charged plate monitor (CPM) is converted into a potential difference Vh between the conductive pattern and load beam in a head gimbal assembly (HGA), using the following expression (1), V h = d h ɛ h . ɛ c...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!