Method and device for evaluating charge potential

In a charge potential evaluation device, the measured value of a potential difference Vc in a charged plate monitor (CPM) is converted into a potential difference Vh between the conductive pattern and load beam in a head gimbal assembly (HGA), using the following expression (1), V h = d h ɛ h . ɛ c...

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1. Verfasser: KAWATA SADAO
Format: Patent
Sprache:eng
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