Method and apparatus for measuring multi-path interference noise in optical amplifier

Power of multi-path interference light is measured by setting the cycle of pulse modulation for a light source in correspondence with the length of an optical medium of a target to be measured, by inputting pulse light after being modulated to the target to be measured, by modulating the pulse signa...

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Bibliographische Detailangaben
Hauptverfasser:	MURO SHINICHIROU, SUGAYA YASUSHI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	Power of multi-path interference light is measured by setting the cycle of pulse modulation for a light source in correspondence with the length of an optical medium of a target to be measured, by inputting pulse light after being modulated to the target to be measured, by modulating the pulse signal light output from the target to be measured with the use of a pulse signal for modulation having the same cycle as the set cycle, and by observing the wavelength dependency of the power of the light after being modulated. In this way, a modulation condition is set according to a condition of a target to be measured when multi-path interference light caused by double Rayleigh scattering light or reflection at the end of a connector is measured with a pulse-OSA method, so that measurement accuracy is improved.